TESCAN AMBER is designed with a focus on versatility, covering both sample characterization at the nanoscale, and everyday FIB applications in the materials research lab. The synergy of its field free ...
Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...
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A comprehensive scanning electron microscopy (SEM) analysis necessitates high-quality specimen preparation. Traditional mechanical sample preparation techniques, such as grinding, polishing, ...
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