Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a "test re-use" strategy ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...

In the IC design flow, design-for-test is often an afterthought. First, the design is coded, then simulated, then synthesized, and only after all that – usually months into the design cycle – it's ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...