EDN

LeCroy Introduces QualiPHY DDR3 Automated Compliance Test Package

CHESTNUT RIDGE, N.Y., Jan. 5 /PRNewswire/ — LeCroy Corporation expands its QualiPHY automated serial data compliance test solutions to include support for DDR3 with a full suite of Clock, Electrical ...
EDN

Test system targets high-volume production DDR3-SDRAM memory

Tokyo—Advantest Corp. is touting its T5503 high-throughput memory test system as having the industry's highest parallel test capability of up to 128 devices. The T5503 was developed specifically to ...
Semiconductor Engineering

DDR Memory Test Challenges From DDR3 to DDR5

Cloud, networking, enterprise, high-performance computing, big data, and artificial intelligence are propelling the development of double data rate (DDR) memory chip technology. Demand for lower power ...
Electronic Design

White Paper: DDR Memory Test Challenges from DDR3 to DDR4 and DDR5

DDR memory chip technology has progressed through two generations in the past 10 years, and the next generation is currently being defined. Each of these generations improved in speed, efficiency, and ...