Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

“We already have a number of Bruker AFMs in our open-access user facilities and are always looking for new technology that can further support the many researchers we serve from both academia and ...

Learn how multi-scale insights from AFM and AFP enhance hybrid bond integrity and device performance.

(Nanowerk News) Take a photo with your phone and you might see wonderful details—leaves on a tree, strands of hair blowing in the wind. The width of that strand of hair is 100,000 nanometers wide. The ...

Polymer materials play an increasingly important role in a variety of industrial applications, thanks to their distinct physical and chemical properties. Among their key mechanical characteristics, ...

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...